Inter-atomic force constants of BaF{sub 2} by diffuse neutron scattering measurement

Journal Article · Thu Apr 16 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4917089· OSTI ID:22391469

Sakuma, Takashi; Makhsun,; Sakai, Ryutaro ^[1]; Xianglian, ^[2]; Takahashi, Haruyuki ^[3]; Basar, Khairul ^[4]; Igawa, Naoki ^[5]; Danilkin, Sergey A. ^[6]

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1. Institute of Applied Beam Science, Ibaraki University, Mito 310-8512 (Japan)
2. College of Physics and Electronics Information, Inner Mongolia University for the Nationalities, Tongliao 028043 (China)
3. Institute of Applied Beam Science, Ibaraki University, Hitachi 316-8511 (Japan)
4. Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung 40132 (Indonesia)
5. Quantum Beam Science Directorate, Japan Atomic Energy Agency, Tokai 319-1195 (Japan)
6. Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC NSW 2232 (Australia)

Diffuse neutron scattering measurement on BaF{sub 2} crystals was performed at 10 K and 295 K. Oscillatory form in the diffuse scattering intensity of BaF{sub 2} was observed at 295 K. The correlation effects among thermal displacements of F-F atoms were obtained from the analysis of oscillatory diffuse scattering intensity. The force constants among neighboring atoms in BaF{sub 2} were determined and compared to those in ionic crystals and semiconductors.

• OSTI ID: 22391469
• Journal Information: AIP Conference Proceedings, Vol. 1656, Issue 1; Conference: APS 2012: 5. Asian Physics Symposium, Bandung (Indonesia), 10-12 Jul 2012; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATOMIC DISPLACEMENTS
ATOMS
BARIUM FLUORIDES
COMPARATIVE EVALUATIONS
CORRELATIONS
CRYSTALS
DIFFUSE SCATTERING
INTERATOMIC FORCES
NEUTRON DIFFRACTION
SEMICONDUCTOR MATERIALS
TEMPERATURE DEPENDENCE