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Title: Calculation of K-shell fluorescence yields for low-Z elements

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4914268· OSTI ID:22391325
 [1];  [2];  [3];  [4]
  1. Department of Materials Science, Faculty of Sciences and Technology, Mohamed El Bachir El Ibrahimi University, Bordj-Bou-Arreridj 34030 (Algeria)
  2. Physics Department, Faculty of Sciences, University of Mohamed Boudiaf, 28000 M’Sila (Algeria)
  3. Department of Metallurgical and Materials Engineering, Faculty of Technology, Mustafa Kemal University, Hatay 31040 (Turkey)
  4. Department of Energy Systems Engineering, Faculty of Technology, Mustafa Kemal University, 31040 Hatay (Turkey)

The analytical methods based on X-ray fluorescence are advantageous for practical applications in a variety of fields including atomic physics, X-ray fluorescence surface chemical analysis and medical research and so the accurate fluorescence yields (ω{sub K}) are required for these applications. In this contribution we report a new parameters for calculation of K-shell fluorescence yields (ω{sub K}) of elements in the range of 11≤Z≤30. The experimental data are interpolated by using the famous analytical function (ω{sub k}/(1−ω{sub k})){sup 1/q} (were q=3, 3.5 and 4) vs Z to deduce the empirical K-shell fluorescence yields. A comparison is made between the results of the procedures followed here and those theoretical and other semi-empirical fluorescence yield values. Reasonable agreement was typically obtained between our result and other works.

OSTI ID:
22391325
Journal Information:
AIP Conference Proceedings, Vol. 1653, Issue 1; Conference: APMAS 2014: 4. International Congress in Advances in Applied Physics and Materials Science, Fethiye (Turkey), 24-27 Apr 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English

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