Diagnostic measurements of CUEBIT based on the dielectronic resonance process

Journal Article · Fri Jan 09 00:00:00 EST 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4905414· OSTI ID:22390847

Takacs, E., E-mail: [e-mail]; Kimmel, T. D., E-mail: [e-mail]; Brandenburg, K. H., E-mail: [e-mail]; Wilson, R. K., E-mail: [e-mail]; Gall, A. C., E-mail: [e-mail]; Harriss, J. E., E-mail: [e-mail]; Sosolik, C. E., E-mail: [e-mail] ^[1]

---

1. Department of Physics and Astronomy, Clemson University, Clemson, SC 29634 (United States)

In this paper we report the first observation of x-ray radiation from the new Clemson University Electron Beam Ion Trap (CUEBIT). The analysis of the emitted dielectronic recombination x-ray photons from highly charged argon ions allowed us to probe parameters specific to the ion cloud inside the machine. Argon dielectronic resonances could provide a standard method to cross-compare the electron beam and ion cloud characteristics of different devices.

• OSTI ID: 22390847
• Journal Information: AIP Conference Proceedings, Vol. 1640, Issue 1; Conference: 12. International Symposium on Electron Beam Ion Sources and Traps, East Lansing, MI (United States), 18-21 May 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
74 ATOMIC AND MOLECULAR PHYSICS
ARGON IONS
COMPARATIVE EVALUATIONS
EDUCATIONAL FACILITIES
ELECTRON BEAMS
MULTICHARGED IONS
PHOTON EMISSION
PHOTONS
RECOMBINATION
RESONANCE
TRAPS
X RADIATION