Characterization of electron-beam recorded microdomain patterns on the nonpolar surface of LiNbO{sub 3} crystal by nondestructive methods
- Institute of Microelectronics Technology and High Purity Materials of the Russian Academy of Sciences, 142432 Chernogolovka, Moscow District (Russian Federation)
- Moscow State Institute of Radio Engineering, Electronics and Automation, 119454 Moscow (Russian Federation)
We report on characterization of the electron-beam fabricated planar domain gratings on the nonpolar (Y-) surface of LiNbO{sub 3} crystals performed with the use of AFM and confocal second harmonic generation (SHG) microscopy. The dependence of domain formation on the irradiation conditions was investigated. The relation of domain thicknesses to the electron penetration depth is experimentally proved. In particular, the possibility of controlling the thickness of planar domains by varying acceleration electron-beam voltages is demonstrated. The observed specificity of SHG is analyzed in the framework of the Kleinman-Boyd theory [G. D. Boyd and D. A. Kleinman, J. Appl. Phys. 39, 3597 (1968)] and Uesu approach [Kaneshiro et al., J. Appl. Phys. 104, 054112 (2008); Kaneshiro et al., J. Opt. Soc. Am. B 27, 888 (2010)] extended in our case to reflection geometry. The calculations performed predict the dependence of SHG conversion efficiency η on the domain thickness, which is in a qualitative agreement with the experiment. It is shown that planar domains on top of the nonpolar surface always enhance the value of η as compared with the bare surface.
- OSTI ID:
- 22350857
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 14; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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