Investigation of thin films of organic-based magnets grown by physical vapor deposition

Journal Article · Mon Oct 06 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4897494· OSTI ID:22350855

Kao, C. Y.; Lu, Y. ^[1]; Li, B. ^[2]; Yoo, J. -W. ^[3]; Epstein, A. J. ^[1]

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1. Department of Chemistry and Biochemistry, Ohio State University, Columbus, Ohio 43210 (United States)
2. MEMSIC, One Tech Drive, Suite 325, Andover, Massachusetts 01810 (United States)
3. School of Materials Science and Engineering-Low dimensional Carbon Materials Center, Ulsan National Institute of Science and Technology, Ulsan 688-798 (Korea, Republic of)

Thin films of organic-based magnet, V[TCNE]{sub x} (TCNE: tetracyanoethylene), were deposited by physical vapor deposition (PVD) based reactive evaporation. The growth conditions were studied in detail. A saturated composition of V[TCNE]{sub ∼1.9} was determined by optimizing the growth condition. Two sets of films with different V to TCNE ratios were characterized. Both films were magnetic ordered up to 400 K and held coercive field of 60 Oe at room temperature. With the presence of excess vanadium within the film, the increase of defects created by PVD results in significant change in electronic property.

• OSTI ID: 22350855
• Journal Information: Applied Physics Letters, Vol. 105, Issue 14; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL DEFECTS
CRYSTAL GROWTH
EVAPORATION
MAGNETS
ORGANIC COMPOUNDS
PHYSICAL VAPOR DEPOSITION
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
VANADIUM COMPLEXES