Engineering 180° ferroelectric domains in epitaxial PbTiO{sub 3} thin films by varying the thickness of the underlying (La,Sr)MnO{sub 3} layer
- Peter Grünberg Institute and Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Research Centre Jülich, D-52425 Jülich (Germany)
- Max Planck Institute for Solid State Research, Heisenbergstr. 1, D-70569 Stuttgart (Germany)
Epitaxial ferroelectric thin films of PbTiO{sub 3} (PTO) grown on top of nominally La{sub 0.7}Sr{sub 0.3}MnO{sub 3} (LSMO) submicron hillocks on Nb-doped SrTiO{sub 3} (100) substrate were investigated by means of scanning transmission electron microscopy. 180° ferroelectric domains were observed in the c-axis oriented PTO films. The formation and configuration of ferroelectric domains and domain walls were found to exhibit strong correlation with the thickness of the underlying LSMO hillocks. The domain walls start at the locations of the hillocks where the LSMO layer has a thickness of about 3 nm. Our results demonstrate that controlling the thickness variation (shape) of the LSMO hillocks can manipulate the position and density of the ferroelectric domain walls, which are considered to be the active elements for future nanoelectronics.
- OSTI ID:
- 22350810
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 13; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CORRELATIONS
DENSITY
DOPED MATERIALS
EPITAXY
FERROELECTRIC MATERIALS
LANTHANUM COMPOUNDS
LAYERS
LEAD COMPOUNDS
MANGANATES
MANGANESE OXIDES
NANOELECTRONICS
NIOBIUM ADDITIONS
STRONTIUM COMPOUNDS
STRONTIUM TITANATES
SUBSTRATES
THICKNESS
THIN FILMS
TITANATES
TRANSMISSION ELECTRON MICROSCOPY