Symmetry and lattice mismatch induced strain accommodation near and away from correlated perovskite interfaces
- Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305 (United States)
- MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede (Netherlands)
Distinct MnO{sub 6} octahedral distortions near and away from the La{sub 0.67}Sr{sub 0.33}MnO{sub 3}/SrTiO{sub 3}(001) (LSMO/STO) interface are quantified using synchrotron x-ray diffraction and dynamical x-ray diffraction simulations. Three structural regions of stress accommodation throughout the film thickness were resolved: near the LSMO/STO interface, intermediate region farther from the interface, and the main layer away from the interface. The results show that within the first two unit cells stress is accommodated by the suppression of octahedral rotations in the film, leading to the expansion of the c-axis lattice parameter. Farther from the interface film structure acquires octahedral tilts similar to thicker perovskite films under tensile stress, leading to a reduced c-axis parameter. We demonstrate that these regions are related to two different strain coupling mechanisms: symmetry mismatch at the interface and lattice mismatch in the rest of the film. The findings suggest new routes for strain engineering in correlated perovskite heterostructures.
- OSTI ID:
- 22350790
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 13; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COUPLING
CRYSTAL DEFECTS
EXPANSION
FILMS
INTERFACES
LANTHANUM COMPOUNDS
LATTICE PARAMETERS
LAYERS
MANGANATES
MANGANESE OXIDES
PEROVSKITE
SIMULATION
STRAINS
STRESSES
STRONTIUM COMPOUNDS
STRONTIUM TITANATES
SYMMETRY
SYNCHROTRON RADIATION
THICKNESS
X-RAY DIFFRACTION