Lu{sub 2}O{sub 3}:Eu{sup 3+} glass ceramic films: Synthesis, structural and spectroscopic studies
- Alumna del posgrado en Tecnología Avanzada del IPN CIITEC Azcapotzalco (Mexico)
- Instituto Politécnico Nacional – CIITEC Azcapotzalco, Cerrada de Cecati S/N, Col. Santa Catarina, Del. Azcapotzalco, C.P. 02250 México, D.F. (Mexico)
- Departamento de Ciencias Naturales, DCNI, UAM Cuajimalpa, Pedro Antonio de los Santos 84, C.P. 11850 México, D.F. (Mexico)
- Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados (CINVESTAV), Departamento de Ingeniería Eléctrica (SEES), Av. Instituto Politécnico Nacional 2508, Col. San Pedro Zacatenco, C.P. 07360 México, D.F. Apartado Postal 14-740, 07000 México, D.F. (Mexico)
- Institut des Molécules et Matériaux du Mans, CNRS6283, Université du Maine, 72085 Le Mans Cedex 9 (France)
Graphical abstract: - Highlights: • Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} films were synthesized by sol–gel and by dip-coating technique. • Effects of incorporating PVP on structural properties were studied. • Effects of incorporating silica (SiO{sub 2}) luminescence characteristics were analyzed. • X-ray diffraction results showed that Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} crystallizes at 700 °C. • The 611 nm emission for the Lu:Si = 8:1 system presented an improvement. - Abstract: For the first time, transparent and crack free europium-doped lutetia silica sol–gel films were synthesized using the dip-coating technique on silica quartz substrates. In this study, we examined the effects of incorporating polyvinylpyrrolidone (PVP) and silica (SiO{sub 2}) into different precursor solutions for different Lu–Si molar ratios: 4:1, 6:1, 8:1 and 10:1. Different systems, such as Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} (using the above Lu:Si molar ratios), were synthesized by sol–gel and by dip-coating technique, employing acetylacetonate lutetium and tetraethylorthosilicate as Lu and Si precursors, in order to produce Lu{sub 2}O{sub 3}:Eu{sup 3+} (5 mol%)@SiO{sub 2} glass–ceramic films. The film microstructure was studied by microRaman spectroscopy (MRS) and X-ray diffraction (XRD) for different Lu:Si molar ratios on films annealed at 700 °C. X-ray diffraction results showed that the lutetium oxide cubic phase crystallizes in the silica matrix at 700 °C, and the crystallite size of Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} films varies from 5 nm to 17 nm according to the respective Lu:Si molar ratios. Opto-geometrical parameters determined by m-lines spectroscopy using a 632.5 nm He–Ne laser showed that the Eu{sup 3+} doped films heat-treated at 700 °C presented a thickness and density of 1.7 μm (8.8 g cm{sup −3}), 970 nm (9.2 g cm{sup −3}), 1 μm (9.3 g cm{sup −3}) and 1.3 μm (9.25 g cm{sup −3}) for the Lu:Si = 4:1, 6:1, 8:1 and 10:1 molar ratio systems, respectively. The Lu:Si = 8:1 system 611 nm emission presented an improvement. These results were provided by photoluminescent spectroscopy.
- OSTI ID:
- 22348620
- Journal Information:
- Materials Research Bulletin, Vol. 51; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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