The origin of bimodal luminescence of β-SiAlON:Eu{sup 2+} phosphors as revealed by fluorescence microscopy and cathodoluminescence analysis

Journal Article · Sat Mar 01 00:00:00 EST 2014 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2013.12.018· OSTI ID:22348596

Gan, Lin ^[1]; Mao, Zhi-Yong ^[2]; Zeng, Xiong-Hui ^[3]; Zhang, Yu-Qiang ^[4]; Zhao, Yang ^[2]; Xu, Fang-Fang ^[1]; Zhu, Ying-Chun ^[5]; Liu, Xue-Jian ^[3]

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1. State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050 (China)
2. University of Chinese Academy of Sciences, Beijing 100049 (China)
3. Electron Microscope Lab, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou 215123 (China)
4. The Research Center of Structural Ceramic Engineering, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050 (China)
5. Inorganic Coating Materials Research Center, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050 (China)

Graphical abstract: - Highlights: • Bimodal emission is originated from β-SiAlON grains with z ≥ 2. • Coexistence of two kinds of emission centers in the β-SiAlON phase is definite. • Fluorescence microscopy shows influence of the z value on emission of β-SiAlON. - Abstract: Eu{sup 2+}-doped SiAlON phosphors with the composition of Eu{sub x}Si{sub 6−z}Al{sub z}O{sub z}N{sub 8−z} (0.5 ≤ z ≤ 3) at a fixed x = 0.01 were synthesized by the gas pressure sintering method. Dependence of luminescence properties on the phase compositions in β-SiAlON:Eu{sup 2+} phosphors has been examined via fluorescence microscope and scanning electron microscope equipped with a cathodoluminescence spectrometer and an energy dispersive spectrometer. Bimodal emission (green and violet) from β-SiAlON phase is observed in the samples with z ≥ 2, indicating co-existence of two different kinds of coordination for Eu{sup 2+} ions in the host lattice.

• OSTI ID: 22348596
• Journal Information: Materials Research Bulletin, Vol. 51; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

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PHOSPHORS
SCANNING ELECTRON MICROSCOPY
SILICON NITRIDES