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Title: Improved crystal orientation and physical properties from single-shot XFEL stills

Journal Article · · Acta Crystallographica. Section D: Biological Crystallography
; ; ; ;  [1]
  1. Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

X-ray free-electron laser crystallography relies on the collection of still-shot diffraction patterns. New methods are developed for optimal modeling of the crystals’ orientations and mosaic block properties. X-ray diffraction patterns from still crystals are inherently difficult to process because the crystal orientation is not uniquely determined by measuring the Bragg spot positions. Only one of the three rotational degrees of freedom is directly coupled to spot positions; the other two rotations move Bragg spots in and out of the reflecting condition but do not change the direction of the diffracted rays. This hinders the ability to recover accurate structure factors from experiments that are dependent on single-shot exposures, such as femtosecond diffract-and-destroy protocols at X-ray free-electron lasers (XFELs). Here, additional methods are introduced to optimally model the diffraction. The best orientation is obtained by requiring, for the brightest observed spots, that each reciprocal-lattice point be placed into the exact reflecting condition implied by Bragg’s law with a minimal rotation. This approach reduces the experimental uncertainties in noisy XFEL data, improving the crystallographic R factors and sharpening anomalous differences that are near the level of the noise.

OSTI ID:
22347732
Journal Information:
Acta Crystallographica. Section D: Biological Crystallography, Vol. 70, Issue Pt 12; Other Information: PMCID: PMC4257623; PMID: 25478847; PUBLISHER-ID: wa5077; OAI: oai:pubmedcentral.nih.gov:4257623; Copyright (c) Sauter et al. 2014; This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0907-4449
Country of Publication:
Denmark
Language:
English

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