In situ fabricate Cu{sub 2}S thin film with hierarchical petal-like nanostructures
Graphical abstract: - Highlights: • Cu{sub 2}S thin films with hierarchical nanostructures have been synthesized by solvothermal method using DMSO as reactant. • The band gap is estimated to be 1.0 eV of the Cu{sub 2}S hierarchical nanostructures. • The form process of Cu{sub 2}S and the possible mechanism of hierarchical nanostructures were proposed. - Abstract: In this paper, Cu{sub 2}S thin film with hierarchical petal-like nanostructures has been successfully in situ synthesized via a solvothermal method using DMSO as reactant under appropriate reaction conditions. The crystalline phase, morphology and optical properties of the resulting products were characterized by X-ray diffraction, energy-dispersive X-ray spectrometry, scanning electron microscopy and UV–vis absorption spectroscopy, respectively. The band gap is estimated to be about 1.0 eV by the results of UV–vis absorption spectroscopy of the Cu{sub 2}S thin film with hierarchical nanostructures that consisted of nanoslices with the thickness of 15 nm. The formation process of Cu{sub 2}S and the possible mechanism of hierarchical nanostructures were also proposed. These findings are valuable since Cu{sub 2}S thin film with hierarchical petal-like nanostructures are promising candidate as lithium ion battery and solar cell materials.
- OSTI ID:
- 22341736
- Journal Information:
- Materials Research Bulletin, Vol. 48, Issue 8; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
77 NANOSCIENCE AND NANOTECHNOLOGY
ABSORPTION SPECTROSCOPY
COPPER SULFIDES
DMSO
LITHIUM ION BATTERIES
LITHIUM IONS
MICROSTRUCTURE
NANOSTRUCTURES
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SOLAR CELLS
SYNTHESIS
THIN FILMS
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY