Interfacial characterization of alumina-to-alumina joints fabricated using silver–copper–titanium interlayers

Journal Article · Tue Apr 01 00:00:00 EDT 2014 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2014.01.009· OSTI ID:22340346

Lin, Kun-Lin ^[1]; Singh, Mrityunjay ^[2]; Asthana, Rajiv ^[3]

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1. National Nano Device Laboratories, Hsinchu 300, Taiwan (China)
2. Ohio Aerospace Institute, Cleveland, OH 44142 (United States)
3. Engineering and Technology Department, University of Wisconsin-Stout, Menomonie, WI 54751 (United States)

Two Ag–Cu–Ti interlayers with different compositions (Ag–35.3Cu–1.75Ti and Ag–26.7Cu–4.5Ti) were used to join sintered polycrystalline Al{sub 2}O{sub 3} having different amounts of porosity to investigate the effect of titanium and porosity contents on evolution of interfacial chemistry and microstructures. X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy dispersive spectroscopy (EDS) were used to characterize the interfacial microstructure. Two reaction layers, Ti{sub 2}O and Cu{sub 3}Ti{sub 3}O, were found at the interface of Ag–Cu–Ti interlayers and Al{sub 2}O{sub 3} using a series of simulated and experimental selected area diffraction patterns (SADP) of TEM and EDS. The total thickness of Ti{sub 2}O and Cu{sub 3}Ti{sub 3}O reaction layers at the interfaces increases with increasing amounts of Ti in the Ag–Cu–Ti interlayers but is independent of the porosity content in the Al{sub 2}O{sub 3}. Two possible formation mechanisms of Ti{sub 2}O and Cu{sub 3}Ti{sub 3}O reaction layers at the interface of Ag–Cu–Ti interlayers and Al{sub 2}O{sub 3} have been proposed based on the interfacial characterization performed in the present study. - Highlights: • Effect of alumina porosity and % Ti in interlayer on interface structure delineated • SEM, EDS, XRD, TEM with SADP used to delineate phases, compositions, crystallography • Ti{sub 2}O and Cu{sub 3}Ti{sub 3}O reaction layers identified and their formation mechanisms proposed.

• OSTI ID: 22340346
• Journal Information: Materials Characterization, Vol. 90; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALUMINIUM OXIDES
COPPER
CRYSTALLOGRAPHY
INTERFACES
MICROSTRUCTURE
POLYCRYSTALS
POROSITY
SCANNING ELECTRON MICROSCOPY
SILVER
SIMULATION
SPECTROSCOPY
THICKNESS
TITANIUM
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION