Phase modulation mode of scanning ion conductance microscopy

Li, Peng; Zhang, Changlin; Liu, Lianqing; Wang, Yuechao; Yang, Yang; Li, Guangyong

doi:10.1063/1.4891571

Title: Phase modulation mode of scanning ion conductance microscopy

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Abstract

This Letter reports a phase modulation (PM) mode of scanning ion conductance microscopy. In this mode, an AC current is directly generated by an AC voltage between the electrodes. The portion of the AC current in phase with the AC voltage, which is the current through the resistance path, is modulated by the tip-sample distance. It can be used as the input of feedback control to drive the scanner in Z direction. The PM mode, taking the advantages of both DC mode and traditional AC mode, is less prone to electronic noise and DC drift but maintains high scanning speed. The effectiveness of the PM mode has been proven by experiments.

Authors:

Li, Peng; Zhang, Changlin ^[1]; Liu, Lianqing; Wang, Yuechao; Yang, Yang ^[1]; Li, Guangyong ^[2]

State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016 (China)
Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261 (United States)

Publication Date:: Mon Aug 04 00:00:00 EDT 2014

OSTI Identifier:: 22314700

Resource Type:: Journal Article

Journal Name:: Applied Physics Letters

Additional Journal Information:: Journal Volume: 105; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951

Country of Publication:: United States

Language:: English

Subject:: 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CLOSED-LOOP CONTROL; ELECTRIC CURRENTS; ELECTRODES; IONS; MODULATION; SCANNING TUNNELING MICROSCOPY

Citation Formats


                    Li, Peng, Zhang, Changlin, University of Chinese Academy of Sciences, Beijing 100049, Liu, Lianqing, Wang, Yuechao, Yang, Yang, and Li, Guangyong. Phase modulation mode of scanning ion conductance microscopy.  United States: N. p., 2014. 
        Web.  doi:10.1063/1.4891571.

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                    Li, Peng, Zhang, Changlin, University of Chinese Academy of Sciences, Beijing 100049, Liu, Lianqing, Wang, Yuechao, Yang, Yang, & Li, Guangyong. Phase modulation mode of scanning ion conductance microscopy.  United States.  https://doi.org/10.1063/1.4891571

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                    Li, Peng, Zhang, Changlin, University of Chinese Academy of Sciences, Beijing 100049, Liu, Lianqing, Wang, Yuechao, Yang, Yang, and Li, Guangyong. 2014.  
        "Phase modulation mode of scanning ion conductance microscopy".  United States.  https://doi.org/10.1063/1.4891571.

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@article{osti_22314700,

  title        = {Phase modulation mode of scanning ion conductance microscopy},

  author       = {Li, Peng and Zhang, Changlin and University of Chinese Academy of Sciences, Beijing 100049 and Liu, Lianqing and Wang, Yuechao and Yang, Yang and Li, Guangyong},

  abstractNote = {This Letter reports a phase modulation (PM) mode of scanning ion conductance microscopy. In this mode, an AC current is directly generated by an AC voltage between the electrodes. The portion of the AC current in phase with the AC voltage, which is the current through the resistance path, is modulated by the tip-sample distance. It can be used as the input of feedback control to drive the scanner in Z direction. The PM mode, taking the advantages of both DC mode and traditional AC mode, is less prone to electronic noise and DC drift but maintains high scanning speed. The effectiveness of the PM mode has been proven by experiments.},

  doi          = {10.1063/1.4891571},

  url          = {https://www.osti.gov/biblio/22314700},
  journal      = {Applied Physics Letters},

  issn         = {0003-6951},

  number       = 5,

  volume       = 105,

  place        = {United States},

  year         = {Mon Aug 04 00:00:00 EDT 2014},

  month        = {Mon Aug 04 00:00:00 EDT 2014}

}

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