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Title: Improved electrical mobility in highly epitaxial La:BaSnO{sub 3} films on SmScO{sub 3}(110) substrates

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4891816· OSTI ID:22314488
; ; ; ; ;  [1]; ; ;  [2]; ;  [3]
  1. Department of Chemistry, University of Liverpool, Crown Street, Liverpool L69 7ZD (United Kingdom)
  2. Stephenson Institute for Renewable Energy and Department of Physics, University of Liverpool, Oxford Street, Liverpool L69 7ZE (United Kingdom)
  3. Research Centre for the Physics of Matter and Radiation, Namur Research Institute for Life Sciences, University of Namur, Namur 500 (Belgium)

Heteroepitaxial growth of BaSnO{sub 3} and Ba{sub 1−x}La{sub x}SnO{sub 3} (x = 7%) lanthanum doped barium stannate thin films on different perovskite single crystal (SrTiO{sub 3} (001) and SmScO{sub 3} (110)) substrates has been achieved by pulsed laser deposition under optimized deposition conditions. X-ray diffraction measurements indicate that the films on either of these substrates are relaxed due to the large mismatch and present a high degree of crystallinity with narrow rocking curves and smooth surface morphology while analytical quantification by proton induced X-ray emission confirms the stoichiometric La transfer from a polyphasic target, producing films with measured La contents above the bulk solubility limit. The films show degenerate semiconducting behavior on both substrates, with the observed room temperature resistivities, Hall mobilities, and carrier concentrations of 4.4 mΩ cm, 10.11 cm{sup 2} V{sup −1} s{sup −1}, and 1.38 × 10{sup 20} cm{sup −3} on SmScO{sub 3} and 7.8 mΩ cm, 5.8 cm{sup 2} V{sup −1} s{sup −1}, and 1.36 × 10{sup 20} cm{sup −3} on SrTiO{sub 3} ruling out any extrinsic contribution from the substrate. The superior electrical properties observed on the SmScO{sub 3} substrate are attributed to reduction in dislocation density from the lower lattice mismatch.

OSTI ID:
22314488
Journal Information:
Applied Physics Letters, Vol. 105, Issue 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English