skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Hybrid monitor for both beam position and tilt of pulsed high-current beams

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4895643· OSTI ID:22314446
; ; ; ;  [1]
  1. Key Laboratory of Pulsed Power, Institute of Fluid Physics, CAEP, P.O. Box 919-106, Mianyang 621900 (China)

A Hybrid beam monitor, integrated with both azimuthal and axial B-dot probes, was designed for simultaneous measurement of both beam position and beam angle for pulsed high-current beams at the same location in beam pipe. The output signals of axial B-dot probes were found to be mixed with signals caused by transverse position deviation. In order to eliminate the unwanted signals, an elimination method was developed and its feasibility tested on a 50-Ω coaxial line test stand. By this method, a waveform, shape-like to that of input current and proportional to the tilt angle, was simulated and processed by following integration step to achieve the tilt angle. The tests showed that the measurement error of displacement and tilt angle less than 0.3 mm and 1.5 mrad, respectively. The latter error could be reduced with improved probes by reducing the inductance of the axial B-dot probe, but the improvement reached a limit due to some unknown systemic mechanism.

OSTI ID:
22314446
Journal Information:
Review of Scientific Instruments, Vol. 85, Issue 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English

Similar Records

Coaxial beam-diagnostic probe
Journal Article · Tue Jan 01 00:00:00 EST 1974 · Nucl. Instrum. Methods, v. 116, no. 1, p. 197 · OSTI ID:22314446

A compact beam position monitor for use inside a Free Electron Laser wiggler
Conference · Thu Nov 12 00:00:00 EST 1987 · OSTI ID:22314446

Resolution Improvement and Pattern Generator Development for theMaskless Micro-Ion-Beam Reduction Lithography System
Thesis/Dissertation · Thu May 18 00:00:00 EDT 2006 · OSTI ID:22314446