Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission

Kowalski, G.; Kępa, H.; Grodecki, K.; Drabińska, A.; Strupiński, W.

doi:10.1134/S1063774513070195

Title: Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission

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Abstract

X-ray diffraction, Raman spectroscopy and Optical absorption estimates of the thickness of graphene multi layer stacks (number of graphene layers) are presented for three different growth techniques. The objective of this work was focused on comparison and reconciliation of the two already widely used methods for thickness estimates (Raman and Absorption) with the calibration of the X-ray method as far as Scherer constant K is concerned and X-ray based Wagner-Aqua extrapolation method.

Authors:

Kowalski, G.; Kępa, H.; Grodecki, K.; Drabińska, A. ^[1]; Strupiński, W. ^[2]

University of Warsaw, Institute of Experimental Physics, Faculty of Physics (Poland)
Institute of Electronic Materials Technology (Poland)

Publication Date:: Sun Dec 15 00:00:00 EST 2013

OSTI Identifier:: 22311413

Resource Type:: Journal Article

Journal Name:: Crystallography Reports

Additional Journal Information:: Journal Volume: 58; Journal Issue: 7; Other Information: Copyright (c) 2013 Pleiades Publishing, Inc.; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7745

Country of Publication:: United States

Language:: English

Subject:: 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL GROWTH; GRAPHENE; RAMAN SPECTROSCOPY; THICKNESS; X RADIATION; X-RAY DIFFRACTION

Citation Formats


                    Tokarczyk, M., E-mail: mateusz.tokarczyk@fuw.edu.pl, Kowalski, G., Kępa, H., Grodecki, K., Drabińska, A., and Strupiński, W. Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission.  United States: N. p., 2013. 
        Web.  doi:10.1134/S1063774513070195.

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                    Tokarczyk, M., E-mail: mateusz.tokarczyk@fuw.edu.pl, Kowalski, G., Kępa, H., Grodecki, K., Drabińska, A., & Strupiński, W. Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission.  United States.  https://doi.org/10.1134/S1063774513070195

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                    Tokarczyk, M., E-mail: mateusz.tokarczyk@fuw.edu.pl, Kowalski, G., Kępa, H., Grodecki, K., Drabińska, A., and Strupiński, W. 2013.  
        "Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission".  United States.  https://doi.org/10.1134/S1063774513070195.

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@article{osti_22311413,

  title        = {Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission},

  author       = {Tokarczyk, M., E-mail: mateusz.tokarczyk@fuw.edu.pl and Kowalski, G. and Kępa, H. and Grodecki, K. and Drabińska, A. and Strupiński, W.},

  abstractNote = {X-ray diffraction, Raman spectroscopy and Optical absorption estimates of the thickness of graphene multi layer stacks (number of graphene layers) are presented for three different growth techniques. The objective of this work was focused on comparison and reconciliation of the two already widely used methods for thickness estimates (Raman and Absorption) with the calibration of the X-ray method as far as Scherer constant K is concerned and X-ray based Wagner-Aqua extrapolation method.},

  doi          = {10.1134/S1063774513070195},

  url          = {https://www.osti.gov/biblio/22311413},
  journal      = {Crystallography Reports},

  issn         = {1063-7745},

  number       = 7,

  volume       = 58,

  place        = {United States},

  year         = {Sun Dec 15 00:00:00 EST 2013},

  month        = {Sun Dec 15 00:00:00 EST 2013}

}

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