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Title: Electron and hole drift mobility measurements on thin film CdTe solar cells

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4891846· OSTI ID:22311198
; ;  [1]; ;  [2]
  1. Department of Physics, Syracuse University, Syracuse, New York 13244-1130 (United States)
  2. First Solar, Inc., 1035 Walsh Ave, Santa Clara, California 95050 (United States)

We report electron and hole drift mobilities in thin film polycrystalline CdTe solar cells based on photocarrier time-of-flight measurements. For a deposition process similar to that used for high-efficiency cells, the electron drift mobilities are in the range of 10{sup −1}–10{sup 0} cm{sup 2}/V s, and holes are in the range of 10{sup 0}–10{sup 1} cm{sup 2}/V s. The electron drift mobilities are about a thousand times smaller than those measured in single crystal CdTe with time-of-flight; the hole mobilities are about ten times smaller. Cells were examined before and after a vapor phase treatment with CdCl{sub 2}; treatment had little effect on the hole drift mobility, but decreased the electron mobility. We are able to exclude bandtail trapping and dispersion as a mechanism for the small drift mobilities in thin film CdTe, but the actual mechanism reducing the mobilities from the single crystal values is not known.

OSTI ID:
22311198
Journal Information:
Applied Physics Letters, Vol. 105, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English