High precision measurement of undulator polarization in the regime of hard x-rays
- Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena (Germany)
- Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg (Germany)
- Helmholtz-Institut Jena, Fröbelstieg 3, D-07743 Jena (Germany)
We have measured the polarization purity of undulator radiation at 12.9 keV, with hitherto unachievable precision. We could measure a polarization purity of 1.8 × 10{sup −4} by using a silicon channel-cut crystal with six Bragg reflections at 45° as analyzer.
- OSTI ID:
- 22311112
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV
Impact of a Vertically Polarized Undulator on LCLS Hard X-ray Experiments
Direct observation of strain segregation ZnO nanorings using x-ray diffraction.
Journal Article
·
Tue Feb 01 00:00:00 EST 2005
· Review of Scientific Instruments
·
OSTI ID:22311112
+3 more
Impact of a Vertically Polarized Undulator on LCLS Hard X-ray Experiments
Technical Report
·
Fri Nov 14 00:00:00 EST 2014
·
OSTI ID:22311112
Direct observation of strain segregation ZnO nanorings using x-ray diffraction.
Conference
·
Sun Jan 01 00:00:00 EST 2006
·
OSTI ID:22311112
+3 more