Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths
- Department of Physics and Optical Science, University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, North Carolina 28223 (United States)
- CREOL, The College of Optics and Photonics, University of Central Florida, 4304 Scorpius St., Orlando, Florida 32816 (United States)
- Department of Physics, Department of Chemistry, and JILA, University of Colorado, 390 UCB, Boulder, Colorado 80309 (United States)
Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays.
- OSTI ID:
- 22308704
- Journal Information:
- Journal of Applied Physics, Vol. 116, Issue 4; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
Polarization-dependent thin-film wire-grid reflectarray for terahertz waves
Poloidal magnetic field profile measurements on the microwave tokamak experiment using far-infrared polarimetry