In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

Journal Article · Mon Jul 21 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4890318· OSTI ID:22308702

Evertsson, J.; Messing, M. E.; Mikkelsen, A.; Lundgren, E. ^[1]; Zhang, F.; Pan, J. ^[2]; Carlà, F. ^[3]; Nilsson, J. -O. ^[4]

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1. Division of Synchrotron Radiation Research, Lund University, Box 118, 221 00 Lund (Sweden)
2. KTH Royal Institute of Technology, School of Chemical Science and Engineering, Department of Chemistry, Division of Surface and Corrosion Science, Drottning Kristinas väg 51, 10044 Stockholm (Sweden)
3. ESRF, B. P. 220, 38043 Grenoble (France)
4. Sapa Technology, Kanalgatan 1, 612 31 Finspång (Sweden)

We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.

• OSTI ID: 22308702
• Journal Information: Journal of Applied Physics, Vol. 116, Issue 3; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM
ALUMINIUM ALLOYS
ANODIZATION
ELECTRIC POTENTIAL
ELECTROCHEMISTRY
FILMS
IMPEDANCE
MONOCRYSTALS
OXIDES
REFLECTIVITY
SCANNING ELECTRON MICROSCOPY
SPECTROSCOPY
SURFACES
THICKNESS
X RADIATION