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Title: Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation

Abstract

We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.

Authors:
 [1]; ;  [2]; ; ; ; ; ;  [3]; ;  [4];  [3]
  1. CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei, Anhui 230027 (China)
  2. The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 (China)
  3. School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907 (United States)
  4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
22308695
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ADVANCED PHOTON SOURCE; ALUMINIUM; GRANULAR MATERIALS; IMAGES; MAPPING; ROUGHNESS; STRAIN RATE; SURFACES; SYNCHROTRON RADIATION; TIME RESOLUTION; VOIDS; X RADIATION; X-RAY RADIOGRAPHY; X-RAY SOURCES

Citation Formats

Lu, L., The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, Fan, D., Luo, S. N., E-mail: sluo@pims.ac.cn, Bie, B. X., School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, Ran, X. X., Qi, M. L., E-mail: qiml@whut.edu.cn, Parab, N., Sun, J. Z., Liao, H. J., Hudspeth, M. C., Claus, B., Fezzaa, K., Sun, T., Chen, W., School of Material Science Engineering, Purdue University, West Lafayette, Indiana 47907, and Gong, X. L., E-mail: gongxl@ustc.edu.cn. Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation. United States: N. p., 2014. Web. doi:10.1063/1.4887343.
Lu, L., The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, Fan, D., Luo, S. N., E-mail: sluo@pims.ac.cn, Bie, B. X., School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, Ran, X. X., Qi, M. L., E-mail: qiml@whut.edu.cn, Parab, N., Sun, J. Z., Liao, H. J., Hudspeth, M. C., Claus, B., Fezzaa, K., Sun, T., Chen, W., School of Material Science Engineering, Purdue University, West Lafayette, Indiana 47907, & Gong, X. L., E-mail: gongxl@ustc.edu.cn. Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation. United States. https://doi.org/10.1063/1.4887343
Lu, L., The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, Fan, D., Luo, S. N., E-mail: sluo@pims.ac.cn, Bie, B. X., School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, Ran, X. X., Qi, M. L., E-mail: qiml@whut.edu.cn, Parab, N., Sun, J. Z., Liao, H. J., Hudspeth, M. C., Claus, B., Fezzaa, K., Sun, T., Chen, W., School of Material Science Engineering, Purdue University, West Lafayette, Indiana 47907, and Gong, X. L., E-mail: gongxl@ustc.edu.cn. 2014. "Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation". United States. https://doi.org/10.1063/1.4887343.
@article{osti_22308695,
title = {Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation},
author = {Lu, L. and The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 and Fan, D. and Luo, S. N., E-mail: sluo@pims.ac.cn and Bie, B. X. and School of Science, Wuhan University of Technology, Wuhan, Hubei 430070 and Ran, X. X. and Qi, M. L., E-mail: qiml@whut.edu.cn and Parab, N. and Sun, J. Z. and Liao, H. J. and Hudspeth, M. C. and Claus, B. and Fezzaa, K. and Sun, T. and Chen, W. and School of Material Science Engineering, Purdue University, West Lafayette, Indiana 47907 and Gong, X. L., E-mail: gongxl@ustc.edu.cn},
abstractNote = {We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.},
doi = {10.1063/1.4887343},
url = {https://www.osti.gov/biblio/22308695}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 7,
volume = 85,
place = {United States},
year = {Tue Jul 15 00:00:00 EDT 2014},
month = {Tue Jul 15 00:00:00 EDT 2014}
}