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Title: On the transmission of terahertz radiation through silicon-based structures

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4890836· OSTI ID:22308561
; ;  [1]; ; ;  [2]; ;  [3]
  1. Institute for Microelectronics and Microsystems–Unit of Lecce, National Council of Research (IMM-CNR), Via Monteroni, Lecce 73100 (Italy)
  2. Institut d'Electronique du Sud, CNRS UMR 5214, TeraLab, University Montpellier 2, Montpellier (France)
  3. Department of Theoretical Physics, Institute of Semiconductor Physics, Kiev 03028 (Ukraine)

We report on the transmission of a terahertz (THz) radiation through prototype structures based on a p-type silicon substrate. In particular, the bare substrate and progressively more complicated multilayer structures were investigated, allowing to address the effect on the transmission of different factors, such as the orientation of interdigitated contacts with respect to the polarized beam, the temperature, and the current flowing through a conductive SnO{sub 2} nanorods layer. A suitable experimental set-up was developed for the direct spectral measurement of transmission in the range of 0.75–1.1 THz at room and low temperatures. A simple Drude-Lorentz model was formulated, finding a quantitative agreement with the experimental transmission spectrum of the bare substrate at room temperature. For the multilayer structures, the spectra variations observed with temperature are well accounted by the corresponding change of the mobility of holes in the silicon p-type substrate. The influence of the contact orientation is consistent with that of a polarizing metallic grating. Finally, Joule heating effects are observed in the spectra performed as a function of the current flowing through the SnO{sub 2} nanorods layer. The experimental results shown here, together with their theoretical interpretation, provide insights for the development of devices fabricated on conductive substrates aimed to absorb/modulate radiation in the THz range.

OSTI ID:
22308561
Journal Information:
Journal of Applied Physics, Vol. 116, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English