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Title: Identification of nitrogen- and host-related deep-level traps in n-type GaNAs and their evolution upon annealing

Abstract

Deep level traps in as-grown and annealed n-GaNAs layers (doped with Si) of various nitrogen concentrations (N=0.2%, 0.4%, 0.8%, and 1.2%) were investigated by deep level transient spectroscopy. In addition, optical properties of GaNAs layers were studied by photoluminescence and contactless electroreflectance. The identification of N- and host-related traps has been performed on the basis of band gap diagram [Kudrawiec, Appl. Phys. Lett. 101, 082109 (2012)], which assumes that the activation energy of electron traps of the same microscopic nature decreases with the rise of nitrogen concentration in accordance with the N-related shift of the conduction band towards trap levels. The application of this diagram has allowed to investigate the evolution of donor traps in GaNAs upon annealing. In general, it was observed that the concentration of N- and host-related traps decreases after annealing and PL improves very significantly. However, it was also observed that some traps are generated due to annealing. It explains why the annealing conditions have to be carefully optimized for this material system.

Authors:
 [1]
  1. School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD (United Kingdom)
Publication Date:
OSTI Identifier:
22306172
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 1; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ACTIVATION ENERGY; ANNEALING; CONCENTRATION RATIO; DEEP LEVEL TRANSIENT SPECTROSCOPY; DOPED MATERIALS; ELECTRONS; GALLIUM ARSENIDES; LAYERS; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; TRAPS

Citation Formats

Gelczuk, Ł., E-mail: lukasz.gelczuk@pwr.edu.pl, Kudrawiec, R., E-mail: robert.kudrawiec@pwr.edu.pl, and Henini, M. Identification of nitrogen- and host-related deep-level traps in n-type GaNAs and their evolution upon annealing. United States: N. p., 2014. Web. doi:10.1063/1.4886856.
Gelczuk, Ł., E-mail: lukasz.gelczuk@pwr.edu.pl, Kudrawiec, R., E-mail: robert.kudrawiec@pwr.edu.pl, & Henini, M. Identification of nitrogen- and host-related deep-level traps in n-type GaNAs and their evolution upon annealing. United States. https://doi.org/10.1063/1.4886856
Gelczuk, Ł., E-mail: lukasz.gelczuk@pwr.edu.pl, Kudrawiec, R., E-mail: robert.kudrawiec@pwr.edu.pl, and Henini, M. 2014. "Identification of nitrogen- and host-related deep-level traps in n-type GaNAs and their evolution upon annealing". United States. https://doi.org/10.1063/1.4886856.
@article{osti_22306172,
title = {Identification of nitrogen- and host-related deep-level traps in n-type GaNAs and their evolution upon annealing},
author = {Gelczuk, Ł., E-mail: lukasz.gelczuk@pwr.edu.pl and Kudrawiec, R., E-mail: robert.kudrawiec@pwr.edu.pl and Henini, M.},
abstractNote = {Deep level traps in as-grown and annealed n-GaNAs layers (doped with Si) of various nitrogen concentrations (N=0.2%, 0.4%, 0.8%, and 1.2%) were investigated by deep level transient spectroscopy. In addition, optical properties of GaNAs layers were studied by photoluminescence and contactless electroreflectance. The identification of N- and host-related traps has been performed on the basis of band gap diagram [Kudrawiec, Appl. Phys. Lett. 101, 082109 (2012)], which assumes that the activation energy of electron traps of the same microscopic nature decreases with the rise of nitrogen concentration in accordance with the N-related shift of the conduction band towards trap levels. The application of this diagram has allowed to investigate the evolution of donor traps in GaNAs upon annealing. In general, it was observed that the concentration of N- and host-related traps decreases after annealing and PL improves very significantly. However, it was also observed that some traps are generated due to annealing. It explains why the annealing conditions have to be carefully optimized for this material system.},
doi = {10.1063/1.4886856},
url = {https://www.osti.gov/biblio/22306172}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 1,
volume = 116,
place = {United States},
year = {Mon Jul 07 00:00:00 EDT 2014},
month = {Mon Jul 07 00:00:00 EDT 2014}
}