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Title: Structural stability and depolarization of manganese-doped (Bi₀.₅Na₀.₅){sub 1−x}Ba{sub x}TiO₃ relaxor ferroelectrics

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4898322· OSTI ID:22305832
 [1];  [1]; ;  [2];  [3];  [4];  [5]
  1. Department of Physics, Fu Jen Catholic University, New Taipei City 24205, Taiwan (China)
  2. Department of Mechanical Engineering, Ming-Chi University of Technology, New Taipei City 24301, Taiwan (China)
  3. Department of Mechanical Engineering, Hwa-Hsia University of Technology, New Taipei City 23567, Taiwan (China)
  4. Department of Physics, Montana State University, Bozeman, Montana 59717 (United States)
  5. Graduate Institute of Applied Science and Engineering, Fu Jen Catholic University, New Taipei City 24205, Taiwan (China)

This work reveals that 0.5 mol. % manganese (Mn) doping in (Bi₀.₅Na₀.₅){sub 1−x}Ba{sub x}TiO₃ (x = 0 and 0.075) solid solutions can increase structural thermal stability, depolarization temperature (T{sub d}), piezoelectric coefficient (d₃₃), and electromechanical coupling factor (kₜ). High-resolution X-ray diffraction and transmission electron microscopy reveal coexistence of rhombohedral (R) R3c and tetragonal (T) P4bm phases in (Bi₀.₅Na₀.₅)₀.₉₂₅Ba₀.₀₇₅TiO₃ (BN7.5BT) and 0.5 mol. % Mn-doped BN7.5BT (BN7.5BT-0.5Mn). (Bi₀.₅Na₀.₅)TiO₃ (BNT) and BN7.5BT show an R − R + T phase transition, which does not occur in 0.5 mol. % Mn-doped BNT (BNT-0.5Mn) and BN7.5BT-0.5Mn. Dielectric permittivity (ε′) follows the Curie-Weiss equation, ε′ = C/(T − T{sub o}), above the Burns temperature (TB), below which polar nanoregions begin to develop. The direct piezoelectric coefficient (d₃₃) and electromechanical coupling factor (kₜ) of BN7.5BT-0.5Mn reach 190 pC/N and 47%.

OSTI ID:
22305832
Journal Information:
Journal of Applied Physics, Vol. 116, Issue 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English