Ultra-narrow ferromagnetic resonance in organic-based thin films grown via low temperature chemical vapor deposition

Journal Article · Mon Jul 07 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4887924· OSTI ID:22304473

Yu, H.; Harberts, M.; Adur, R.; Hammel, P. Chris; Lu, Y. ^[1]

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1. Department of Chemistry, The Ohio State University, Columbus, Ohio 43210-1173 (United States)

We present the growth of thin films of the organic-based ferrimagnetic semiconductor V[TCNE]{sub x} (x ∼ 2, TCNE: tetracyanoethylene) via chemical vapor deposition. Under optimized growth conditions, we observe a significant increase in magnetic homogeneity, as evidenced by a Curie temperature above 600 K and sharp magnetization switching. Further, ferromagnetic resonance studies reveal a single resonance with full width at half maximum linewidth of 1.4 G, comparable to the narrowest lines measured in inorganic magnetic materials and in contrast to previous studies that showed multiple resonance features. These characteristics are promising for the development of high frequency electronic devices that take advantage of the unique properties of this organic-based material, such as the potential for low cost synthesis combined with low temperature and conformal deposition on a wide variety of substrates.

• OSTI ID: 22304473
• Journal Information: Applied Physics Letters, Vol. 105, Issue 1; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMICAL VAPOR DEPOSITION
CRYSTAL GROWTH
CURIE POINT
FERROMAGNETIC RESONANCE
MAGNETIC MATERIALS
MAGNETIC SEMICONDUCTORS
MAGNETIZATION
ORGANIC SEMICONDUCTORS
SEMICONDUCTOR MATERIALS
SUBSTRATES
SYNTHESIS
TEMPERATURE RANGE 0400-1000 K
THIN FILMS