skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Ultrahigh sensitive sub-terahertz detection by InP-based asymmetric dual-grating-gate high-electron-mobility transistors and their broadband characteristics

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4885499· OSTI ID:22304448
; ; ; ;  [1];  [2]; ;  [3];  [4];  [5]
  1. Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)
  2. Institut d'Electronique, de Microélectronique et de Nanotechnologie, 59562 Villeneuve d'Ascq Cedex (France)
  3. Laboratoire Charles Coulomb, UMR 5221, Université Montpellier 2 - CNRS, F-34095 Montpellier (France)
  4. Departamento de Fisica Aplicada, Universidad de Salamanca, Salamanca 37008 (Spain)
  5. Kotelnikov Institute of Radio Engineering and Electronics, 410019 Saratov (Russian Federation)

We report on room-temperature plasmonic detection of sub-terahertz radiation by InAlAs/InGaAs/InP high electron mobility transistors with an asymmetric dual-grating-gate structure. Maximum responsivities of 22.7 kV/W at 200 GHz and 21.5 kV/W at 292 GHz were achieved under unbiased drain-to-source condition. The minimum noise equivalent power was estimated to be 0.48 pW/Hz{sup 0.5} at 200 GHz at room temperature, which is the record-breaking value ever reported for plasmonic THz detectors. Frequency dependence of the responsivity in the frequency range of 0.2–2 THz is in good agreement with the theory.

OSTI ID:
22304448
Journal Information:
Applied Physics Letters, Vol. 104, Issue 25; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English