Atomic resolution electrostatic potential mapping of graphene sheets by off-axis electron holography

Journal Article · Sat Jun 21 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4883192· OSTI ID:22304003

Cooper, David ^[1]; Pan, Cheng-Ta; Haigh, Sarah ^[2]

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1. University Grenoble Alpes, F-38000 Grenoble (France)
2. School of Materials, The University of Manchester, Manchester M13 9PL (United Kingdom)

Off-axis electron holography has been performed at atomic resolution with the microscope operated at 80 kV to provide electrostatic potential maps from single, double, and triple layer graphene. These electron holograms have been reconstructed in order to obtain information about atomically resolved and mean inner potentials. We propose that off-axis electron holography can now be used to measure the electrical properties in a range of two-dimensional semiconductor materials and three dimensional devices comprising stacked layers of films to provide important information about their electrical properties.

• OSTI ID: 22304003
• Journal Information: Journal of Applied Physics, Vol. 115, Issue 23; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRICAL PROPERTIES
ELECTRONS
ELECTROSTATICS
EQUIPMENT
FILMS
GRAPHENE
HOLOGRAPHY
LAYERS
RESOLUTION
SEMICONDUCTOR MATERIALS
TWO-DIMENSIONAL CALCULATIONS