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Title: 2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

Abstract

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.

Authors:
; ;  [1]; ;  [2];  [3];  [4]
  1. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)
  2. Graduate School of Engineering, Nagoya University, Chikusa, Nagoya 464-8603 (Japan)
  3. Graduate School of Frontier Sciences, The University of Tokyo, Chiba 277-8561 (Japan)
  4. Pesco Corporation Limited, Toki, Gifu 509-5123 (Japan)
Publication Date:
OSTI Identifier:
22303699
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; BEAM TRANSPORT; HEAVY IONS; ION BEAMS; ION PROBES; LHD DEVICE; TWO-DIMENSIONAL CALCULATIONS

Citation Formats

Shimizu, A., E-mail: akihiro@nifs.ac.jp, Ido, T., Kato, S., Hamada, Y., Kurachi, M., Makino, R., Nishiura, M., and Nishizawa, A. 2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device. United States: N. p., 2014. Web. doi:10.1063/1.4891975.
Shimizu, A., E-mail: akihiro@nifs.ac.jp, Ido, T., Kato, S., Hamada, Y., Kurachi, M., Makino, R., Nishiura, M., & Nishizawa, A. 2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device. United States. https://doi.org/10.1063/1.4891975
Shimizu, A., E-mail: akihiro@nifs.ac.jp, Ido, T., Kato, S., Hamada, Y., Kurachi, M., Makino, R., Nishiura, M., and Nishizawa, A. 2014. "2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device". United States. https://doi.org/10.1063/1.4891975.
@article{osti_22303699,
title = {2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device},
author = {Shimizu, A., E-mail: akihiro@nifs.ac.jp and Ido, T. and Kato, S. and Hamada, Y. and Kurachi, M. and Makino, R. and Nishiura, M. and Nishizawa, A.},
abstractNote = {Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.},
doi = {10.1063/1.4891975},
url = {https://www.osti.gov/biblio/22303699}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 11,
volume = 85,
place = {United States},
year = {Sat Nov 15 00:00:00 EST 2014},
month = {Sat Nov 15 00:00:00 EST 2014}
}