Release path temperatures of shock-compressed tin from dynamic reflectance and radiance measurements
- National Security Technologies, LLC, Special Technologies Laboratory, Santa Barbara, California 93111 (United States)
- Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
- National Security Technologies, LLC, Los Alamos Operations, Los Alamos, New Mexico 87544 (United States)
Dynamic reflectance and radiance measurements were conducted for tin samples shock compressed to 35 GPa and released to 15 GPa using high explosives. We determined the reflectance of the tin samples glued to lithium fluoride windows using an integrating sphere with an internal xenon flashlamp as an illumination source. The dynamic reflectance (R) was determined at near normal incidence in four spectral bands with coverage in visible and near-infrared spectra. Uncertainties in R/R{sub 0} are <2%, and uncertainties in absolute reflectance are <5%. In complementary experiments, thermal radiance from the tin/glue/lithium fluoride interface was recorded with similar shock stress and spectral coverage as the reflectance measurements. The two sets of experiments were combined to obtain the temperature history of the tin surface with an uncertainty of <2%. The stress at the interface was determined from photonic Doppler velocimetry and combined with the temperatures to obtain temperature-stress release paths for tin. We discuss the relationship between the experimental release paths and release isentropes that begin on the principal shock Hugoniot.
- OSTI ID:
- 22303579
- Journal Information:
- Journal of Applied Physics, Vol. 114, Issue 6; Other Information: (c) 2013 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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