Clean surface processing of rubrene single crystal immersed in ionic liquid by using frequency modulation atomic force microscopy

Journal Article · Mon Jun 30 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4886154· OSTI ID:22303400

Yokota, Yasuyuki; Hara, Hisaya; Morino, Yusuke; Bando, Ken-ichi; Imanishi, Akihito; Fukui, Ken-ichi ^[1]; Uemura, Takafumi; Takeya, Jun ^[2]

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1. Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531 (Japan)
2. Department of Advanced Materials Science, Graduate School of Frontier Science, The University of Tokyo, 5-1-5 Kashiwa, Chiba 277-8561 (Japan)

Surface processing of a rubrene single crystal immersed in ionic liquids is valuable for further development of low voltage transistors operated by an electric double layer. We performed a precise and clean surface processing based on the tip-induced dissolution of rubrene molecules at the ionic liquid/rubrene single crystal interfaces by using frequency modulation atomic force microscopy. Molecular resolution imaging revealed that the tip-induced dissolution proceeded via metastable low density states derived from the anisotropic intermolecular interactions within the crystal structure.

• OSTI ID: 22303400
• Journal Information: Applied Physics Letters, Vol. 104, Issue 26; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANISOTROPY
ATOMIC FORCE MICROSCOPY
CRYSTAL STRUCTURE
DENSITY
DISSOLUTION
ELECTRIC POTENTIAL
FREQUENCY MODULATION
INTERACTIONS
INTERFACES
MOLECULES
MOLTEN SALTS
MONOCRYSTALS
PROCESSING
RESOLUTION
SURFACE CLEANING
SURFACES
TRANSISTORS