Erratum: “Total ionizing dose effect of γ-ray radiation on the switching characteristics and filament stability of HfOx resistive random access memory” [Appl. Phys. Lett. 104, 183507 (2014)]
- School of Computing, Informatics, and Decision Systems Engineering, Arizona State University, Tempe, Arizona 85281 (United States)
- School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona 85287 (United States)
No abstract prepared.
- OSTI ID:
- 22300125
- Journal Information:
- Applied Physics Letters, Vol. 104, Issue 21; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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