Entanglement-assisted electron microscopy based on a flux qubit

Okamoto, Hiroshi; Nagatani, Yukinori

doi:10.1063/1.4865244

Title: Entanglement-assisted electron microscopy based on a flux qubit

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Abstract

A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.

Authors:

Okamoto, Hiroshi ^[1]; Nagatani, Yukinori ^[2]

Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan)
National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)

Publication Date:: Mon Feb 10 00:00:00 EST 2014

OSTI Identifier:: 22283155

Resource Type:: Journal Article

Journal Name:: Applied Physics Letters

Additional Journal Information:: Journal Volume: 104; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951

Country of Publication:: United States

Language:: English

Subject:: 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; MAGNETIC FLUX; QUANTUM ENTANGLEMENT; QUBITS; RADIATION EFFECTS; RADIOWAVE RADIATION; RESOLUTION; SQUID DEVICES; SUPERCONDUCTORS; TRANSMISSION ELECTRON MICROSCOPY

Citation Formats


                    Okamoto, Hiroshi, and Nagatani, Yukinori. Entanglement-assisted electron microscopy based on a flux qubit.  United States: N. p., 2014. 
        Web.  doi:10.1063/1.4865244.

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                    Okamoto, Hiroshi, & Nagatani, Yukinori. Entanglement-assisted electron microscopy based on a flux qubit.  United States.  https://doi.org/10.1063/1.4865244

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                    Okamoto, Hiroshi, and Nagatani, Yukinori. 2014.  
        "Entanglement-assisted electron microscopy based on a flux qubit".  United States.  https://doi.org/10.1063/1.4865244.

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@article{osti_22283155,

  title        = {Entanglement-assisted electron microscopy based on a flux qubit},

  author       = {Okamoto, Hiroshi and Nagatani, Yukinori},

  abstractNote = {A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.},

  doi          = {10.1063/1.4865244},

  url          = {https://www.osti.gov/biblio/22283155},
  journal      = {Applied Physics Letters},

  issn         = {0003-6951},

  number       = 6,

  volume       = 104,

  place        = {United States},

  year         = {Mon Feb 10 00:00:00 EST 2014},

  month        = {Mon Feb 10 00:00:00 EST 2014}

}

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