Deep Co penetration and spin-polarization of C{sub 60} molecules at hybridized Co-C{sub 60} interfaces

Journal Article · Mon Jan 27 00:00:00 EST 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4863414· OSTI ID:22280565

Cheng, Pei-Yu; Chan, Yuet-Loy; Hsu, Yao-Jane ^[1]; Chiang, Meng-Ruei ^[1]; Wang, Pen-Cheng ^[2]

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1. National Synchrotron Radiation Research Center, 30076 Hsinchu, Taiwan (China)
2. Graduate Program for Science and Technology of Synchrotron Light Source, National Tsing Hua University, 30013 Hsinchu, Taiwan (China)

We used near-edge x-ray absorption fine structure spectroscopy to identify the interplays at organic semiconductor-ferromagnet interfaces. When monitoring the L-edge intensity of 0.36 nm Co depositing on C{sub 60} films of various thicknesses, we detected weaker Co signal from structures with larger C{sub 60} thicknesses. Having determined that the electron mean escape depth in C{sub 60} is 4.9 nm, further model analysis indicates that the decline of spectral intensity is due to deep penetration of Co clusters. Finally, C K-edge spectra reveal clear evidences of orbital hybridization between Co and C{sub 60} as well as a visible dichroic effect at 125 K.

• OSTI ID: 22280565
• Journal Information: Applied Physics Letters, Vol. 104, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTRA
ABSORPTION SPECTROSCOPY
COBALT
ELECTRONS
FERROMAGNETIC MATERIALS
FINE STRUCTURE
FULLERENES
INTERFACES
MOLECULES
ORGANIC SEMICONDUCTORS
SPIN ORIENTATION
THICKNESS
THIN FILMS
X-RAY SPECTRA
X-RAY SPECTROSCOPY