Gamma radiation induced effects in floppy and rigid Ge-containing chalcogenide thin films
- Department of Electrical Engineering, Boise State University, 1910 University Dr. Boise, Idaho 83725-2075 (United States)
- School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287-9309 (United States)
- Department of Physics, Arizona State University, Tempe, Arizona 85287-1504 (United States)
- Department of Material Science and Engineering, Boise State University, 1910 University Dr. Boise, Idaho 83725-2090 (United States)
We explore the radiation induced effects in thin films from the Ge-Se to Ge-Te systems accompanied with silver radiation induced diffusion within these films, emphasizing two distinctive compositional representatives from both systems containing a high concentration of chalcogen or high concentration of Ge. The studies are conducted on blanket chalcogenide films or on device structures containing also a silver source. Data about the electrical conductivity as a function of the radiation dose were collected and discussed based on material characterization analysis. Raman Spectroscopy, X-ray Diffraction Spectroscopy, and Energy Dispersive X-ray Spectroscopy provided us with data about the structure, structural changes occurring as a result of radiation, molecular formations after Ag diffusion into the chalcogenide films, Ag lateral diffusion as a function of radiation and the level of oxidation of the studied films. Analysis of the electrical testing suggests application possibilities of the studied devices for radiation sensing for various conditions.
- OSTI ID:
- 22275829
- Journal Information:
- Journal of Applied Physics, Vol. 115, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CONCENTRATION RATIO
DIFFUSION
ELECTRIC CONDUCTIVITY
ELECTRICAL TESTING
GAMMA RADIATION
GERMANIUM SELENIDES
GERMANIUM TELLURIDES
OXIDATION
PHYSICAL RADIATION EFFECTS
RADIATION DOSES
RAMAN SPECTROSCOPY
SILVER
THIN FILMS
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY