Channeling in direct dark matter detection II: channeling fraction in Si and Ge crystals

Journal Article · Mon Nov 01 00:00:00 EDT 2010 · Journal of Cosmology and Astroparticle Physics

DOI:https://doi.org/10.1088/1475-7516/2010/11/028· OSTI ID:22275387

Bozorgnia, Nassim; Gelmini, Graciela B. ^[1]; Gondolo, Paolo ^[2]

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1. Department of Physics and Astronomy, UCLA, 475 Portola Plaza, Los Angeles, CA 90095 (United States)
2. Department of Physics and Astronomy, University of Utah, 115 South 1400 East 201, Salt Lake City, UT 84112 (United States)

The channeling of the ion recoiling after a collision with a WIMP changes the ionization signal in direct detection experiments, producing a larger signal than otherwise expected. We give estimates of the fraction of channeled recoiling ions in Si and Ge crystals using analytic models produced since the 1960's and 70's to describe channeling and blocking effects. We used data obtained to avoid channeling in the implantation of dopants in Si crystals to test our models.

• OSTI ID: 22275387
• Journal Information: Journal of Cosmology and Astroparticle Physics, Vol. 2010, Issue 11; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 1475-7516
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL DOPING
CRYSTALS
ION CHANNELING
ION COLLISIONS
ION IMPLANTATION
NONLUMINOUS MATTER
RECOILS
SI SEMICONDUCTOR DETECTORS
SIGNALS
WIMPS