Electronic structure of Fe/MgO/Fe multilayer stack by X-ray magnetic circular dichroism
- Materials Science Division, Inter-University Accelerator Centre, New Delhi 110-067 (India)
- National Synchrotron Radiation Research Center, Hsinchu 30 076, Taiwan (China)
The interface properties of Fe/MgO/Fe multilayer stack were investigated by using X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD). The magnetic multilayers were deposited by electron beam evaporation method, which exhibits the attributes of perpendicular magnetic anisotropy (PMA). XAS analysis shows that Fe-layer forms a Fe-O-rich interface region with MgO-layer and a sum-rule analysis of the XMCD estimates the average magnetic moment of 2.31 ± 0.1 μ{sub B} per Fe-atom. XAS and XMCD studies indicate the formation of a heterostructure (Fe/FeO/Fe{sub 2}O{sub 3}) on the interface. A phase transition in Fe-O stoichiometry at interface is also observed at low temperature (90 K), which may be useful in magnetic storage technology.
- OSTI ID:
- 22273873
- Journal Information:
- Journal of Applied Physics, Vol. 115, Issue 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
On the quality of molecular-beam epitaxy grown Fe/MgO and Co/MgO(001) interfaces
Origin of Interfacial Magnetic Anisotropy in Ta/CoFeB/MgO and Pt/CoFeB/MgO Multilayer Thin Film Stacks