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Title: Holographic recording and characterization of photorefractive Bi{sub 2}TeO{sub 5} crystals at 633 nm wavelength light

Abstract

We report on the holographic recording on photorefractive Bi{sub 2}TeO{sub 5} crystals using λ=633 nm wavelength light. We studied the behavior of this material under the action of this low photonic energy light and found out the presence of a fast and a slow hologram, both of photorefractive nature and exhibiting rather high diffraction efficiencies. The faster and the slower holograms are based on the excitation and diffusion of oppositely charged carriers (likely electrons and holes). Relevant parameters for the photoactive centers responsible for both kind of holograms were characterized using purely holographic techniques. No evidences of non-photosensitive ionic charge carriers being involved in the recording process at room temperature nor self-fixing effects were found.

Authors:
 [1];  [2]
  1. Instituto de Física/Universidade Federal de Goiás, Goiânia-GO (Brazil)
  2. Instituto de Física “Gleb Wataghin”/UNICAMP, Campinas-SP (Brazil)
Publication Date:
OSTI Identifier:
22273499
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 115; Journal Issue: 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BISMUTH COMPOUNDS; CHARGE CARRIERS; CRYSTALS; DIFFRACTION; DIFFUSION; ELECTRONS; EXCITATION; HOLES; HOLOGRAPHY; TELLURIUM OXIDES; TEMPERATURE RANGE 0273-0400 K; VISIBLE RADIATION

Citation Formats

Oliveira, Ivan de, E-mail: ivan@ft.unicamp.br, Carvalho, Jesiel F., E-mail: carvalho@if.ufg.br, Fabris, Zanine V., and Frejlich, Jaime. Holographic recording and characterization of photorefractive Bi{sub 2}TeO{sub 5} crystals at 633 nm wavelength light. United States: N. p., 2014. Web. doi:10.1063/1.4871807.
Oliveira, Ivan de, E-mail: ivan@ft.unicamp.br, Carvalho, Jesiel F., E-mail: carvalho@if.ufg.br, Fabris, Zanine V., & Frejlich, Jaime. Holographic recording and characterization of photorefractive Bi{sub 2}TeO{sub 5} crystals at 633 nm wavelength light. United States. https://doi.org/10.1063/1.4871807
Oliveira, Ivan de, E-mail: ivan@ft.unicamp.br, Carvalho, Jesiel F., E-mail: carvalho@if.ufg.br, Fabris, Zanine V., and Frejlich, Jaime. 2014. "Holographic recording and characterization of photorefractive Bi{sub 2}TeO{sub 5} crystals at 633 nm wavelength light". United States. https://doi.org/10.1063/1.4871807.
@article{osti_22273499,
title = {Holographic recording and characterization of photorefractive Bi{sub 2}TeO{sub 5} crystals at 633 nm wavelength light},
author = {Oliveira, Ivan de, E-mail: ivan@ft.unicamp.br and Carvalho, Jesiel F., E-mail: carvalho@if.ufg.br and Fabris, Zanine V. and Frejlich, Jaime},
abstractNote = {We report on the holographic recording on photorefractive Bi{sub 2}TeO{sub 5} crystals using λ=633 nm wavelength light. We studied the behavior of this material under the action of this low photonic energy light and found out the presence of a fast and a slow hologram, both of photorefractive nature and exhibiting rather high diffraction efficiencies. The faster and the slower holograms are based on the excitation and diffusion of oppositely charged carriers (likely electrons and holes). Relevant parameters for the photoactive centers responsible for both kind of holograms were characterized using purely holographic techniques. No evidences of non-photosensitive ionic charge carriers being involved in the recording process at room temperature nor self-fixing effects were found.},
doi = {10.1063/1.4871807},
url = {https://www.osti.gov/biblio/22273499}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 16,
volume = 115,
place = {United States},
year = {Mon Apr 28 00:00:00 EDT 2014},
month = {Mon Apr 28 00:00:00 EDT 2014}
}