In situ controlled modification of the helium density in single helium-filled nanobubbles

Journal Article · Fri Mar 28 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4869213· OSTI ID:22271170

Pailloux, F. ^[1]; Alix, K.; Mauchamp, V.; Pizzagalli, L. ^[1]; Couillard, M.; Botton, G. A. ^[2]

---

1. Institut Pprime, UPR 3346 CNRS-Université de Poitiers, SP2MI, 86962 Futuroscope-Chasseneuil cedex (France)
2. Canadian Centre for Electron Microscopy, Mc Master University, 1280 Main Street West, Hamilton, Ontario L8S 4M1 (Canada)

We demonstrate that the helium density and corresponding pressure can be modified in single nano-scale bubbles embedded in semiconductors by using the electron beam of a scanning transmission electron microscope as a multifunctional probe: the measurement probe for imaging and chemical analysis and the irradiation source to modify concomitantly the pressure in a controllable way by fine tuning of the electron beam parameters. The control of the detrapping rate is achieved by varying the experimental conditions. The underlying physical mechanisms are discussed; our experimental observations suggest that the helium detrapping from bubbles could be interpreted in terms of direct ballistic collisions, leading to the ejection of the helium atoms from the bubble.

• OSTI ID: 22271170
• Journal Information: Journal of Applied Physics, Vol. 115, Issue 12; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMS
BUBBLES
CHEMICAL ANALYSIS
DENSITY
ELECTRON BEAMS
HELIUM
IRRADIATION
MODIFICATIONS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
TRANSMISSION ELECTRON MICROSCOPY