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Title: Preparation of Cu-doped nickel oxide thin films and their properties

Copper doped Nickel oxide film was preferred on glass substrate by simple nebulizer technique keeping the substrate temperature at 350°C and characterized by X-ray diffraction (XRD), Photoluminescence (PL) and Four probe resistivity measurements. XRD studies indicated cubic structure and the crystallites are preferentially oriented along the [111] direction. Interesting results have been obtained from the study of PL spectra. A peak corresponding to 376nm in the emission spectra for 0%, 5% and 10% copper doped samples. The samples show sharp and strong UV emission corresponding to the near band edge emission under excitation of 275nm.
Authors:
; ;  [1] ;  [2]
  1. School of Physics, Alagappa University, Karaikudi-630004 (India)
  2. Alagappa Chettiar College of Engineering and Technology, Karaikudi-630004 (India)
Publication Date:
OSTI Identifier:
22271049
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CONCENTRATION RATIO; COPPER COMPOUNDS; CUBIC LATTICES; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; EMISSION SPECTRA; EXCITATION; GLASS; NICKEL OXIDES; PHOTOLUMINESCENCE; SUBSTRATES; THIN FILMS; ULTRAVIOLET RADIATION; X-RAY DIFFRACTION