Optical properties of (Se{sub 80}Te{sub 20}){sub 100−x}Ag{sub x} (0 ≤ x ≤ 4) thin films

Journal Article · Thu Apr 24 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4872987· OSTI ID:22269327

Singh, D., E-mail: [e-mail]; Kumar, S., E-mail: [e-mail]; Sandhu, S., E-mail: [e-mail]; Thangaraj, R., E-mail: [e-mail] ^[1]

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1. Semiconductors Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar-143005, Punjab (India)

Thin films of (Se{sub 80}Te{sub 20}){sub 100−x}Ag{sub x} (0 ≤ x ≤ 4) glasses were prepared by thermal evaporation of the bulk samples. The transmittance (T) and reflection (R) spectra of amorphous thin films were obtained in the spectral region in the range 400–2500 nm. The optical band gap (E{sub g}) has been determined by Tauc’s extrapolation method. The surface morphology has been determined by the Scanning Electron Microscopy (SEM)

• OSTI ID: 22269327
• Journal Information: AIP Conference Proceedings, Vol. 1591, Issue 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
EXTRAPOLATION
GLASS
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SPECTRA
SURFACES
THIN FILMS