Exfoliation of self-assembled 2D organic-inorganic perovskite semiconductors

Journal Article · Mon Apr 28 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4874846· OSTI ID:22267721

Niu, Wendy; Baumberg, Jeremy J. ^[1]; Eiden, Anna ^[2]; Vijaya Prakash, G. ^[3]

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1. NanoPhotonics Centre, Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE (United Kingdom)
2. Cambridge Graphene Centre, Engineering Department, University of Cambridge, 9, JJ Thomson Avenue, Cambridge CB3 0FA (United Kingdom)
3. Nanophotonics Lab, Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016 (India)

Ultra-thin flakes of 2D organic-inorganic perovskite (C{sub 6}H{sub 9}C{sub 2}H{sub 4}NH{sub 3}){sub 2}PbI{sub 4} are produced using micromechanical exfoliation. Mono- and few-layer areas are identified using optical and atomic force microscopy, with an interlayer spacing of 1.6 nm. Refractive indices extracted from the optical spectra reveal a sample thickness dependence due to the charge transfer between organic and inorganic layers. These measurements demonstrate a clear difference in the exciton properties between “bulk” (>15 layers) and very thin (<8 layer) regions as a result of the structural rearrangement of organic molecules around the inorganic sheets.

• OSTI ID: 22267721
• Journal Information: Applied Physics Letters, Vol. 104, Issue 17; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
CARBON
HYDROGEN
LAYERS
LEAD
NITROGEN
PEROVSKITE
REFRACTIVE INDEX
SEMICONDUCTOR MATERIALS