Extracting strength from high pressure ramp-release experiments
- Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
- Sandia National Laboratories, Livermore, California 94450 (United States)
- School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164 (United States)
Unloading from a plastically deformed state has long been recognized as a sensitive measure of a material's deviatoric response. In the case of a ramp compression and unload, time resolved particle velocity measurements of a sample/window interface may be used to gain insight into the sample material's strength. Unfortunately, measurements of this type are often highly perturbed by wave interactions associated with impedance mismatches. Additionally, wave attenuation, the finite pressure range over which the material elastically unloads, and rate effects further complicate the analysis. Here, we present a methodology that overcomes these shortcomings to accurately calculate a mean shear stress near peak compression for experiments of this type. A new interpretation of the self-consistent strength analysis is presented and then validated through the analysis of synthetic data sets on tantalum to 250 GPa. The synthetic analyses suggest that the calculated shear stresses are within 3% of the simulated values obtained using both rate-dependent and rate-independent constitutive models. Window effects are addressed by a new technique referred to as the transfer function approach, where numerical simulations are used to define a mapping to transform the experimental measurements to in situ velocities. The transfer function represents a robust methodology to account for complex wave interactions and a dramatic improvement over the incremental impedance matching methods traditionally used. The technique is validated using experiments performed on both lithium fluoride and tantalum ramp compressed to peak stresses of 10 and 15 GPa, respectively. In each case, various windows of different shock impedance are used to ensure consistency within the transfer function analysis. The data are found to be independent of the window used and in good agreement with previous results.
- OSTI ID:
- 22266135
- Journal Information:
- Journal of Applied Physics, Vol. 114, Issue 22; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
Analysis of shockless dynamic compression data on solids to multi-megabar pressures: Application to tantalum
Analysis of shockless dynamic compression data on solids to multi-megabar pressures: Application to tantalum