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Title: Measurement of the intrinsic damping constant in individual nanodisks of Y{sub 3}Fe{sub 5}O{sub 12} and Y{sub 3}Fe{sub 5}O{sub 12}|Pt

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4871516· OSTI ID:22262604
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  1. Service de Physique de l’État Condensé (CNRS URA 2464), CEA Saclay, 91191 Gif-sur-Yvette (France)
  2. Unité Mixte de Physique CNRS/Thales and Université Paris Sud 11, 1 Ave. Fresnel, 91767 Palaiseau (France)
  3. Instituto de Sistemas Optoelectrónicos y Microtecnología (UPM), Madrid 28040 (Spain)
  4. Instituto de Microelectrónica de Madrid (CNM, CSIC), Madrid 28760 (Spain)

We report on an experimental study on the spin-waves relaxation rate in two series of nanodisks of diameter ϕ=300, 500, and 700 nm, patterned out of two systems: a 20 nm thick yttrium iron garnet (YIG) film grown by pulsed laser deposition either bare or covered by 13 nm of Pt. Using a magnetic resonance force microscope, we measure precisely the ferromagnetic resonance linewidth of each individual YIG and YIG|Pt nanodisks. We find that the linewidth in the nanostructure is sensibly smaller than the one measured in the extended film. Analysis of the frequency dependence of the spectral linewidth indicates that the improvement is principally due to the suppression of the inhomogeneous part of the broadening due to geometrical confinement, suggesting that only the homogeneous broadening contributes to the linewidth of the nanostructure. For the bare YIG nano-disks, the broadening is associated to a damping constant α=4 × 10{sup −4}. A threefold increase of the linewidth is observed for the series with Pt cap layer, attributed to the spin pumping effect. The measured enhancement allows to extract the spin mixing conductance found to be G{sub ↑↓}=1.55 × 10{sup 14} Ω{sup −1} m{sup −2} for our YIG(20nm)|Pt interface, thus opening large opportunities for the design of YIG based nanostructures with optimized magnetic losses.

OSTI ID:
22262604
Journal Information:
Applied Physics Letters, Vol. 104, Issue 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English