Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

Journal Article · Mon Apr 21 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4872165· OSTI ID:22262563

Mehravar, S. S.; Herrera, O. D.; Demir, V.; Kieu, K.; Norwood, R. A.; Peyghambarian, N. ^[1]; Luo, J. ^[2]

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1. College of Optical Sciences, University of Arizona, Tucson, Arizona 85721 (United States)
2. Soluxra LLC, Seattle, Washington 98195 (United States)

We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r{sub 33}) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from V{sub π} measurements) were used to validate the correlation between the second-harmonic signal and r{sub 33}. This also allowed us to locally map the r{sub 33} coefficient in the poled area.

• OSTI ID: 22262563
• Journal Information: Applied Physics Letters, Vol. 104, Issue 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
MICROSCOPY
MULTI-PHOTON PROCESSES
POLYMERS
SILICON
THIN FILMS