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Title: Transient Rayleigh scattering from single semiconductor nanowires

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4848467· OSTI ID:22261883
; ;  [1];  [2]; ; ; ;  [3]
  1. Department of Physics, University of Cincinnati, Cincinnati, OH 45221-0011 (United States)
  2. Department of Physics, Miami University, Oxford, OH 45056 (United States)
  3. Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200 (Australia)

Transient Rayleigh scattering spectroscopy is a new pump-probe technique to study the dynamics and cooling of photo-excited carriers in single semiconductor nanowires. By studying the evolution of the transient Rayleigh spectrum in time after excitation, one can measure the time evolution of the density and temperature of photo-excited electron-hole plasma (EHP) as they equilibrate with lattice. This provides detailed information of dynamics and cooling of carriers including linear and bimolecular recombination properties, carrier transport characteristics, and the energy-loss rate of hot electron-hole plasma through the emission of LO and acoustic phonons.

OSTI ID:
22261883
Journal Information:
AIP Conference Proceedings, Vol. 1566, Issue 1; Conference: ICPS 2012: 31. international conference on the physics of semiconductors, Zurich (Switzerland), 29 Jul - 3 Aug 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English