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Title: Split-illumination electron holography for improved evaluation of electrostatic potential associated with electrophotography

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4869830· OSTI ID:22261636
; ;  [1]; ;  [2];  [3]; ;  [1];  [4]
  1. Center for Emergent Matter Science (CEMS), RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198 (Japan)
  2. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Sendai 980-8577 (Japan)
  3. Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012 (Japan)
  4. Product Environment Technology Development Department, Environment and Energy Technology Development Center R and D Group, RICOH Co., Ltd., Shinei-cho, Tsuzuki-ku, Yokohama, Kanagawa 224-0035 (Japan)

Precise evaluation of the electrostatic potential distributions of and around samples with multiple charges using electron holography has long been a problem due to unknown perturbation of the reference wave. Here, we report the first practical application of split-illumination electron holography (SIEH) to tackle this problem. This method enables the use of a non-perturbed reference wave distant from the sample. SIEH revealed the electrostatic potential distributions at interfaces of the charged particles used for development in electrophotography and should lead to dramatic improvements in electrophotography.

OSTI ID:
22261636
Journal Information:
Applied Physics Letters, Vol. 104, Issue 13; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English

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