Induced lattice strain in epitaxial Fe-based superconducting films on CaF{sub 2} substrates: A comparative study of the microstructures of SmFeAs(O,F), Ba(Fe,Co){sub 2}As{sub 2}, and FeTe{sub 0.5}Se{sub 0.5}
- Central Research Institute of Electric Power Industry, 2-6-1 Nagasaka, Yokosuka 240-0195 (Japan)
- Department of Basic Science, The University of Tokyo, Meguro, Tokyo 153-8902 (Japan)
- Institute for Metallic Materials, IFW Dresden, 01171 Dresden (Germany)
- Department of Applied Physics, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588 (Japan)
The microstructures of SmFeAs(O,F), Ba(Fe,Co){sub 2}As{sub 2}, and FeTe{sub 0.5}Se{sub 0.5} prepared on CaF{sub 2} substrates were investigated using transmission electron microscopy. The SmFeAs(O,F)/CaF{sub 2} interface is steep, without a disordered layer. By contrast, a chemical reaction occurs at the interface in the cases of Ba(Fe,Co){sub 2}As{sub 2} and FeTe{sub 0.5}Se{sub 0.5}. The reaction layers are located on opposite sides of the interface for Ba(Fe,Co){sub 2}As{sub 2} and FeTe{sub 0.5}Se{sub 0.5}. We found that the lattice distortion of the three superconducting films on the CaF{sub 2} substrates enhances the T{sub C} values compared with films prepared on oxide substrates. The origin of this lattice deformation varies depending on the superconducting material.
- OSTI ID:
- 22258578
- Journal Information:
- Applied Physics Letters, Vol. 104, Issue 12; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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