Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder
Journal Article
·
· Review of Scientific Instruments
- Aix-Marseille Université, CNRS, CINaM UMR 7325, 13288 Marseille (France)
We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.
- OSTI ID:
- 22254917
- Journal Information:
- Review of Scientific Instruments, Vol. 85, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Selected energy epitaxial deposition and low energy electron microscopy of AlN, GaN and SiC thin films. Quarterly report, 1 April--30 June 1998
ZnO nanocrystals on SiO{sub 2}/Si surfaces thermally cleaned in ultrahigh vacuum and characterized using spectroscopic photoemission and low energy electron microscopy
Foreword for the special issue on the Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy
Technical Report
·
Mon Jun 01 00:00:00 EDT 1998
·
OSTI ID:22254917
ZnO nanocrystals on SiO{sub 2}/Si surfaces thermally cleaned in ultrahigh vacuum and characterized using spectroscopic photoemission and low energy electron microscopy
Journal Article
·
Sat May 15 00:00:00 EDT 2010
· Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films
·
OSTI ID:22254917
Foreword for the special issue on the Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy
Journal Article
·
Thu Jun 15 00:00:00 EDT 2017
· Ultramicroscopy
·
OSTI ID:22254917