Morphological origin for the stratification of P3HT:PCBM blend film studied by neutron reflectometry
- Neutron Science Directorate, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
- Center for Nanophase Material Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
Understanding the origin for the film stratification of electron donor/acceptor blend is crucial for high efficiency organic photovoltaic cell. In this study, P3HT:PCBM blend is deposited onto hydrophilic and hydrophobic substrate to examine the film stratifications. The neutron reflectivity results show that, on the different surfaces, PCBM diffuses toward the two interfacial regions in an identical fashion during thermal annealing. This evidences that the film stratification is not affected by the substrates. Instead, since P3HT remains more amorphous in the interfacial regions and PCBM is miscible with amorphous P3HT, PCBM preferentially diffuses to the interfacial regions, resulting in the stratification.
- OSTI ID:
- 22253962
- Journal Information:
- Applied Physics Letters, Vol. 103, Issue 22; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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