Development of spectrally selective imaging system for negative hydrogen ion source

Journal Article · Sat Feb 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4842318· OSTI ID:22253824

Nakano, H.; Tsumori, K.; Kisaki, M.; Nagaoka, K.; Osakabe, M.; Takeiri, Y.; Kaneko, O. ^[1]

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1. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)

A spectrally selective imaging system has been developed to obtain a distribution of H{sub α} emissions at the extraction region in a hydrogen negative ion source. The diagnostic system consisted of an aspherical lens, optical filters, a fiber image conduit, and a charge coupled device detector was installed on the 1/3-scaled hydrogen negative ion source in the National Institute for Fusion Science. The center of sight line passes beside the plasma grid (PG) surface with the distance of 11 mm, and the viewing angle has coverage 35 mm from the PG surface. Two dimensional H{sub α} distribution in the range up to 20 mm from the PG surface was clearly observed. The reduction area for H{sub α} emission caused by beam extraction was widely distributed in the extraction region near the PG surface.

• OSTI ID: 22253824
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMINO ACIDS
ANIONS
BEAM EXTRACTION
CHARGE-COUPLED DEVICES
HYDROGEN IONS
IMAGE PROCESSING
IMAGES
ION BEAMS
OPTICAL FILTERS